Low Pressure Chemical Vapor Deoposition, LPCVD, is utilized in the deposition of many silicon based compounds at pressures ranging from about 0.1T to 10T and temperatures ranging from 500-900C.
| Processing Technique | Equipment name & NEMO ID | Cleanliness | Materials Lab Supplied | Material Thickness Range | Substrate Size | Maximum Load (number of wafers) | Process Temperature Range | Gases | Cleaning Required | Notes | Stylus Tip Radius |
|---|---|---|---|---|---|---|---|---|---|---|---|
| EPI (CVD), Low Pressure (LP) CVD, Hydrogen (H2) Annealing, Doping, Plasma Enhanced (PE) CVD |
AMAT Centurion Epitaxial System epi2 |
Clean |
50.00 Å -
3.00 μm
|
1 |
600 °C - 1200 °C
|
Pre-Diffusion Clean |
N and P doping available- intrinsic to 5E19 Operating pressure range is 5-300Torr |
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| Low Pressure (LP) CVD |
Tystar Bank 1 Tube 3 Poly B1T3 Flexible Poly |
Flexible |
25.00 Å -
2.00 μm
|
100 |
420 °C - 630 °C
|
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| Low Pressure (LP) CVD |
Tystar Bank 1 Tube 4 LTO B1T4 Flexible LTO |
Flexible |
25.00 Å -
2.00 μm
|
100 |
300 °C - 500 °C
|
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| Low Pressure (LP) CVD |
Tystar Bank 2 Tube 7 Nitride B2T7 Flexible Nitride |
Flexible |
25.00 Å -
2.00 μm
|
50 |
420 °C - 800 °C
|
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| Low Pressure (LP) CVD |
Tystar Bank 2 Tube 8 LTO B2T8 Clean LTO |
Clean |
25.00 Å -
2.00 μm
|
100 |
300 °C - 500 °C
|
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| Low Pressure (LP) CVD |
Tystar Bank 3 Tube 10 Nitride B3T10 Clean Nitride |
Clean |
25.00 Å -
2.00 μm
|
50 |
420 °C - 800 °C
|
Pre-Diffusion Clean | |||||
| Low Pressure (LP) CVD |
Tystar Bank 3 Tube 11 TEOS B3T11 Clean TEOS |
Clean |
25.00 Å -
2.00 μm
|
50 |
420 °C - 630 °C
|
Pre-Diffusion Clean | |||||
| Low Pressure (LP) CVD |
Tystar Bank 3 Tube 12 Poly B3T12 Clean Poly |
Clean |
25.00 Å -
2.00 μm
|
50 |
420 °C - 630 °C
|
Pre-Diffusion Clean |