This is an archive of requests from 2013 to 2021. New requests are not being added here.
PROM Request Title PROM Date PROM Request Summary Equipment List PROM Decision
SiO2 films on Si wafers soaked in IPA solvent 02/13/2015 (all day) Request to bring wet samples soaked in IPA into the SNF. Approved. Please contact PROM Committee (snf-promcommittee at lists dot stanford dot edu) for more information.
Lampoly HBr/Cl2/O2 etching of silicon on lithium niobiate 02/07/2015 (all day) Request to introduce lithium niobiate substrate into SNF etchers. Lam Research TCP 9400 Poly Etcher (lampoly) Pending contamination study documentation.
Contamination Study of Semi-Clean SiGe in LAMpoly 02/02/2015 (all day) Request to perform contamination study of Semi-Clean SiGe in LAMpoly. Lam Research TCP 9400 Poly Etcher (lampoly),
CMP GnP POLI-400L (cmp)
Approved for study. Resubmission is required after data is collected. // Update 2/18/15: TiN layer deposition at Berkeley is approved due to extended Fiji1 downtime. // Update 3/31/15: Contamination data appended. Process flow is approved.
Use of toluene at Headway 01/15/2015 (all day) Request to use toluene in SNF. Headway Manual Resist Spinner (headway2) Approved. Even though there will be no chemical storage in the SNF, chemicals must be logged and a yellow sticker placed on the bottle while in use in the SNF.
Initial Characterization of Cyclotene XUS 35077.00 Type 02 Resin 01/07/2015 (all day) Request to use Cyclotene XUS Resin in SNF. Approved. Until refrigerator is available in the cleanroom, temporary storage offered in refrigerator in chemical store room. // Please contact PROM Committee (snf-promcommittee at lists dot stanford dot edu) for more information
Diamine (DAH) Precursor for MLD of Polymers 12/04/2014 (all day) Request for new precursor for MVD. Savannah ALD (savannah) Approved.
Constantan (0.55Cu-0.45Ni) sputtering target for Metalica 11/19/2014 (all day) Request for new Metallica target. Approved.
Contamination Study of ZnO Anneal 11/18/2014 (all day) Request to collect data to determine impact of ZnO anneal in furnaces. Savannah ALD (savannah) Approved. Data will be updated once results are back.
use of dry film photoresist (MX5015) with developer (0.75wt% potassium carbonate) and remover (EKC-162) 11/11/2014 (all day) Request to use alternate dry film photoresist and developer. Potassium carbonate handling requires specific safety precautions. Headway Manual Resist Spinner (headway2) Approved. Any changes to location or quantities need review.
PT-DSE to CLEAN contamination process flow 11/06/2014 (all day) Request to process materials in CLEAN process equipment after PT-DSE. This requires a change in contamination policy. AMAT Centurion Epitaxial System (epi2) Conditional approval. Data must be analyzed before final approval.

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