Atomic Force Microscopy (AFM) |
AFM Bruker Dimension ICON |
afm
|
|
SNSF X-ray & Surface Analysis Shriram Shriram 99 |
Atomic Force Microscopy (AFM) |
Asylum AFM afm-asylum |
Atomic force microscopy.
|
Flexible |
SNF Exfab Paul G Allen 151 Ocean |
Step Profile |
Dektak XT-S Stylus Profiler SNSF NPC |
Surface profiler measures step heights as small as 10nm. Stylus tip radius is 12.5 microns.
|
|
SNSF NPC Cleanroom Spilker suite006 |
Step Profile |
Profilometer Alphastep 500 alphastep |
Surface profiler measures step heights from 500 Å to 300 µm on materials in the flexible cleanliness group. Scan length from 100 Angstroms up to 0.3 mm. Stylus tip radius is 5 µm.
|
Flexible |
SNF Exfab Paul G Allen 104 Stinson |
Step Profile |
Profilometer AlphaStep D-300 alphastep2 |
A stylus-based (tip radius 2 microns) surface profiler that measures step heights from 50nm to 300 µm on materials.
|
Flexible |
SNF Exfab Paul G Allen 104 Stinson |
Optical Profilometer, Interferometry |
Sensofar S-neox s-neox |
3D optical profiler combining confocal, interferometry, and focus variation techniques to measure the surface height of smooth to very rough, ideally reflecting surfaces.
|
All |
SNF Cleanroom Paul G Allen L107 |
Step Profile |
Tencor P2 Profilometer p2 |
Surface profiler measures step heights from 500 Å to 80 µm on materials in the clean cleanliness group. Pieces to 8 inch wafers. Stepheight 500 Å to 80µm. Scan length 0.01 mm to 210 mm. Stylus tip radius is 12.5 µm.
|
Clean, Semiclean |
SNF Cleanroom Paul G Allen L107 |