Overview
The Dektak XT-S Stylus Profiler is capable of quickly and accurately measuring feature heights on a surface. With noise levels approaching 2-3nm it is capable of resolving step heights as small as 10nm. Variable force and measurement length settings make measurements possible on a wide range of materials and structures. A magnified video targeting system permits positioning the needle tip near small surface features. Stylus tip radius is 12.5 microns.
Processing Technique(s)
Capabilities and Specifications
Characterization Specifications
Stylus Tip Radius:
12.5 µm
Maximum Load:
1
Lab Organization, Location, and NEMO Information
Lab Organization:
Location:
Training and Maintenance
Lab Facility:
Steps to become a tool user
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