Overview
The Lakeshore 8404 Hall measurement tool is installed in Allen 151 at SNF and we have demonstrated the functionality by AlGaN/GaN HEMT, diamond and 2D material samples. The capability of this tool:
- Ideal for variable temperature measurement and mobilities from 1 to 106 cm2/V s
- Optional AC field extends mobility measurement range down to 10-3 cm2/V s
- Maximum DC fields to 1.67 T
- Optional AC fields to 1.18 T
- Standard resistance range of 0.5 mΩ to 10 MΩ
- Temperatures from 15 K to 1273 K
Cleanliness:
Processing Technique(s)
Capabilities and Specifications
Material Thickness Range:
100.0
μm
1000.0
μm
Process Temperature Range:
-258 °C - 1000 °C
Characterization Specifications
Sample Size Limits:
8 in wafer
Resolution Notes:
Sensor Transducer Size is 14 mm diameter
Substrate Type
Substrate Sizes
Maximum Load:
1 piece
Lab Organization, Location, and NEMO Information
Lab Organization:
Location:
NEMO Area:
NEMO ID:
LakeshoreHall
Training and Maintenance
Lab Facility:
Training Charges:
3.00 hours
Primary Trainer:
Primary Maintenance:
Steps to become a tool user
Become a member of nano@stanford.
Become a member of SNF.
- Contact the primary trainer: Swaroop Kommera