Microscopy

Technique Tabs

Main Tab

Processing Techniques	Equipment name & NEMO ID	Teaser Blurb	Cleanliness	Location
Microscopy	Keyence Digital Microscope VHX-6000 keyence	Microscopy	All	SNF Exfab Paul G Allen 104 Stinson
Microscopy	SEM -Zeiss Merlin sem-merlin	Mid-Range SEM for inspection of wafer defects, etch depths, and lithography overlay.	All	SNF Exfab Paul G Allen 104 Stinson

Detail Tab

Processing Technique	Equipment name & NEMO ID	Cleanliness	Material Thickness Range	Substrate Size
Microscopy	Keyence Digital Microscope VHX-6000 keyence	All		Pieces 2" 3" 4" 6"
Microscopy	SEM -Zeiss Merlin sem-merlin	All	0.00 mm - 35.00 mm	Pieces 2" 3" 4" 6" Disks