Ellipsometry is a non-destructive, non-contact analysis method that can be used to characterize thickness (depth), crystalline nature, doping concentration, electrical conductivity, composition, and other material properties of thin films.
| Processing Techniques | Equipment name & NEMO ID | Teaser Blurb | Cleanliness | Location |
|---|---|---|---|---|
| Ellipsometry |
Woollam woollam |
"All" | SNF Paul G Allen L107 Cleanroom |