Overview

Sinton lifetime tester WCT-100 is used to test minority carrier lifetime at a specified minority carrier density. Electrons are the usual minority carries in a p-doped semiconductor and holes are the usual minority carriers in n-doped semiconductors. Minority carrier lifetime is the average time that the minority carrier spends in a semiconductor from generation to recombination.  

Cleanliness: 

Processing Technique(s)

Capabilities and Specifications

Process Temperature Range:

Substrate Sizes

Lab Organization, Location, and NEMO Information

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NEMO ID: 
sinton-lifetime-tester

Training and Maintenance