PVD is characterized by a process in which the material goes from a condensed phase to a vapor phase and then back to a thin film condensed phase. The most common PVD processes are sputtering and evaporation.
| Processing Technique | Equipment name & NEMO ID | Cleanliness | Materials Lab Supplied | Material Thickness Range | Substrate Size | Maximum Load (number of wafers) | Process Temperature Range | Gases | Notes | Stylus Tip Radius |
|---|---|---|---|---|---|---|---|---|---|---|
| Evaporation |
AJA Evaporator aja-evap |
Flexible |
0.00 -
300.00 nm
|
4"x3 or 6"x1 wafers or pieces |
For more than 300nm deposition, please contact Graham Ewing<grahamj.ewing@stanford.edu> in advance |
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| Evaporation |
AJA2 Evaporator aja2-evap |
Flexible |
0.00 -
300.00 nm
|
4"x3 or 6"x1 wafers or pieces |
For more than 300nm deposition, please contact Gabe Catalano <gcatalano@stanford.edu> in advance |
|||||
| Evaporation |
CHA Solutions II Evaporator cha-evap |
Flexible |
0.00 -
300.00 nm
|
4"x15 or 6"x3 wafers or pieces |
For more than 300nm deposition, please contact Neel Mehta <nmehta26@stanford.edu> in advance |
|||||
| Sputtering |
Hummer V Sputter Coater hummer |
Flexible | ||||||||
| Evaporation |
Intlvac Evaporator Intlvac_evap |
Clean, Semiclean |
0.00 -
0.50 μm
|
12 4 inch wafers, 2 6 inch wafers | ||||||
| Sputtering |
Lesker Sputter lesker-sputter |
Flexible | 1 4 inch wafer, 1 6 inch wafer |
reactive O2/N2 sputtering, substrate bias, substrate heating, co-sputter |
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| Sputtering |
Lesker2 Sputter lesker2-sputter |
Semiclean |
1.00 μm
|
one 4 inch wafer, one 6 inch wafer |
°C - 800 °C
|
reactive O2/N2 sputtering, substrate bias, substrate heating, co-sputter |