| Processing Techniques | Equipment name & NEMO ID | Teaser Blurb | Cleanliness | Location |
|---|---|---|---|---|
| Scanning Electron Microscopy (SEM) |
SEM -Zeiss Merlin sem-merlin |
Mid-Range SEM for inspection of wafer defects, etch depths, and lithography overlay. |
"All" | SNF Exfab Paul G Allen L104 Stinson |
| Microscopy |
Keyence Digital Microscope VHX-6000 keyence |
Microscopy |
"All" | SNF Exfab Paul G Allen L104 Stinson |
Stanford Nanofabrication Facility
Lab User Guide