Equipment name & NEMO ID | Training Required & Charges | Cleanliness | Location | Notes |
---|---|---|---|---|
Nanospec 210XP nanospec2 |
Nanospec Training | All | SNF Exfab Paul G Allen 104 Stinson |
Manual Film Thickness Measurement. Single or dual layer transparent films > 300 Ã |
Profilometer Alphastep 500 alphastep |
Alphastep 500 Profilometer Training | Flexible | SNF Exfab Paul G Allen 104 Stinson |
500Å to 300µm |
SEM -Zeiss Merlin sem-merlin |
SEM-Merlin Training | All | SNF Exfab Paul G Allen 104 Stinson | |
Profilometer AlphaStep D-300 alphastep2 |
AlphaStep2 Training | Flexible | SNF Exfab Paul G Allen 104 Stinson |
Equipment name & NEMO ID | Technique | Cleanliness | Primary Materials Etched | Process Temperature Range | Chemicals | Gases | Substrate Size | Substrate Type | Maximum Load |
---|---|---|---|---|---|---|---|---|---|
Wet Bench Resist Strip wbresstrip-1 |
Clean (Ge), Semiclean, Flexible |
20 °C - 60 °C
|
, , , , , , |
25 4 inch wafers | |||||
Wet Bench Solvent Lithography lithosolv |
Flexible |
, , , , , , , , |
|||||||
Woollam woollam |
All |
, , , , , , , , , , , , , |
1 | ||||||
Xactix Xenon Difluoride Etcher xactix |
All |
, , , , , , , , , |
1 |