Equipment name & NEMO ID | Training Required & Charges | Cleanliness | Location | Notes |
---|---|---|---|---|
Prometrix Resistivity Mapping System prometrix |
Prometrix Training | All | SNF Cleanroom Paul G Allen L107 |
3 Probe Heads for different cleanliness groups. |
PlasmaTherm Shuttlelock PECVD System ccp-dep |
PlasmaTherm Shuttlelock PECVD System Training | All | SNF Cleanroom Paul G Allen L107 |
To maintain cleanliness level, cleans of both the chamber and wafers are required prior to processing - Substrates in clean category: Pre-Diffusion Clean For semi-clean substrates: Standard Metal Clean (SRS100 + PRS1000) . Run Chamber clean (no dummies) and conditioning with clean dummies prior to run |
Plasmaetch PE-50 plasma-etch |
Plasmaetch PE-50 Training | Flexible | SNF Exfab Paul G Allen 155 Mavericks |
Low power, high pressure plasma; low bias, minimal damage. Often used for surface treatment At SNF - nSiL lab |
Plasma Therm Versaline LL ICP Metal Etcher PT-MTL |
Plasma Therm Versaline LL ICP Metal Etcher Training | Flexible | SNF Cleanroom Paul G Allen L107 |
Single wafer; Default 4" config; Can be converted to 6" config; pieces need to be attached to carrier wafer; Restrictions: Can not etch metals or metal oxides with no volatile by-products (shorting & arcing issues) |
Plasma Therm Versaline LL ICP Dielectric Etcher PT-Ox |
Plasma Therm Versaline LL ICP Dielectric Etcher Training | Flexible | SNF Cleanroom Paul G Allen L107 |
Single wafer; Default 4" config; Can be converted to 6" config; pieces need to be attached to carrier wafer; Restrictions: Can not etch metals or metal oxides with no volatile by-products (shorting & arcing issues) |
Plasma Therm Versaline LL ICP Deep Silicon Etcher PT-DSE |
Plasma Therm Versaline LL ICP Deep Silicon Etcher Training | Flexible | SNF Cleanroom Paul G Allen L107 |
Single wafer; Bosch process for Si etching; Default 4" config; Can be converted to 6" config; pieces need to be attached to carrier wafer; need a support wafer for through wafer etching, can be used for Isotropic Si Etching |
Oxford III-V etcher Ox-35 |
Oxford III-V etcher Training | Flexible | SNF Cleanroom Paul G Allen L107 |
Metal etching or Metal hard masks are not allowed. 4" wafers; can be adopted to do 6" or 8" wafers; pieces need to be bonded to carrier wafers; Restrictions: III-V materials only. |
Oxford Dielectric Etcher oxford-rie |
Oxford Dielectric Etcher Training | Flexible | SNF Cleanroom Paul G Allen L107 |
4" wafers; can be adopted to do 6" or 8" wafers; pieces need to be bonded to carrier wafers |
Optomec Printer optomec-printer |
Optomec Printer Training | Flexible | SNF Exfab Paul G Allen 155A Venice | |
Nanospec 210XP nanospec2 |
Nanospec Training | All | SNF Exfab Paul G Allen 104 Stinson |
Manual Film Thickness Measurement. Single or dual layer transparent films > 300 Ã |
MRC Reactive Ion Etcher mrc |
MRC Reactive Ion Etcher Training | Flexible | SNF Cleanroom Paul G Allen L107 |
Typically used for sputter etching; Single wafer, direct load system; wafers/ pieces can be directly placed on electrode |
micromanipulator6000 IV-CV probe station micromanipulator6000 |
micromanipulator6000 IV-CV probe station Training | All | SNF Exfab Paul G Allen 151 Ocean | |
Matrix Plasma Resist Strip matrix |
Matrix Plasma Resist Strip Training | Flexible | SNF Cleanroom Paul G Allen L107 |
Single wafer tool with auto loading from a cassette. Pieces need a pocket carrier wafer for transport. Chuck temperature controls wafer heating. |
Wet Bench Solvent Lithography lithosolv |
Lithography Solvent Bench Training | Flexible | SNF Cleanroom Paul G Allen L107 |
Manual solvent cleaning of substrates or masks. Teflon coated metal tweezers cleaning. |
Laurell Manual Resist Spinner laurell-R |
Laurell Manual Resist Spinner Training | All | SNF Cleanroom Paul G Allen L107 |
SU-8, LOL, Ebeam resists allowed. No Acetone allowed. |
Lam Research TCP 9400 Poly Etcher lampoly |
Lam Research TCP 9400 Poly Etcher Training | Clean, Semiclean | SNF Cleanroom Paul G Allen L107 |
Single wafer etch with auto-loading from a cassette. Equipment originally used for gate etching with high selectivity to thin gate oxides. |
Karl Suss MA-6 Contact Aligner karlsuss2 |
Contact Aligner Karl Suss MA-6 Training | All | SNF Cleanroom Paul G Allen L107 |
1:1 Contact Aligner. |
Karl Suss MA-6 Contact Aligner karlsuss |
Contact Aligner Karl Suss MA-6 Training | All | SNF Cleanroom Paul G Allen L107 |
1:1 Contact Aligner. |
Woollam woollam |
Woollam Training | All | SNF Cleanroom Paul G Allen L107 | |
Headway Manual Resist Spinner headway2 |
Resist Coat (manual) Headway Manual Training | All | SNF Cleanroom Paul G Allen L107 |
Adjustable spin speeds, spin time. SNF-acceptable resists or polymers. Ebeam resists |
Equipment name & NEMO ID | Technique | Cleaning Required | Cleanliness | Primary Materials Etched | Other Materials Etched | Material Thickness Range | Materials Lab Supplied | Resist | Developer | Process Temperature Range | Gases | Sample Size Limits | Substrate Size | Substrate Type | Maximum Load |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
RTA AllWin 610 aw610_r |
Flexible |
21 °C - 1150 °C
|
, , |
||||||||||||
Samco PC300 Plasma Etch System samco |
Flexible |
20 ºC
|
, , , , , , , , , , , , , |
Four 4" wafers or two 6" wafers and one 8" wafer | |||||||||||
Savannah ALD savannah |
Flexible |
1.00 Å -
50.00 nm
|
24 °C - 250 °C
|
, , , , , , , , , , , , |
|||||||||||
SEM -Zeiss Merlin sem-merlin |
All |
0.00 mm -
35.00 mm
|
6 in wafer |
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|||||||||||
Sensofar S-neox s-neox |
All |
, , , , , , , , |
1 | ||||||||||||
Sinton Lifetime Tester sinton-lifetime-tester |
Flexible | ||||||||||||||
SPTS uetch vapor etch uetch |
All |
, , , , , , , , , |
1 | ||||||||||||
SVG Develop Track 1 svgdev |
All |
, , , , , , , , |
25 4 inch wafers | ||||||||||||
SVG Develop Track 2 svgdev2 |
All |
, , , , , , , , |
25 4 inch wafers | ||||||||||||
SVG Resist Coat Track 1 svgcoat |
All |
, , , , , , , , |
25 4 inch wafers | ||||||||||||
SVG Resist Coat Track 2 svgcoat2 |
All |
, , , , , , , , |
25 4 inch wafers | ||||||||||||
Technics Asher technics |
Flexible |
, , |
Four 4" wafers to pieces, one 6" or 8" wafer | ||||||||||||
Tencor P2 Profilometer p2 |
Clean, Semiclean |
, , , , , , , , |
1 | ||||||||||||
Tystar Bank 1 Tube 1 B1T1 Flexible Oxide |
Flexible |
25.00 Å -
2.00 μm
|
400 °C - 1100 °C
|
, , |
100 | ||||||||||
Tystar Bank 1 Tube 2 B1T2 Flexible Oxide Anneal |
Flexible |
25.00 Å -
2.00 μm
|
400 °C - 1100 °C
|
, , |
100 | ||||||||||
Tystar Bank 1 Tube 3 Poly B1T3 Flexible Poly |
Flexible |
25.00 Å -
2.00 μm
|
420 °C - 630 °C
|
, , , , , |
100 | ||||||||||
Tystar Bank 1 Tube 4 LTO B1T4 Flexible LTO |
Flexible |
25.00 Å -
2.00 μm
|
300 °C - 500 °C
|
, , , , , |
100 | ||||||||||
Tystar Bank 2 Tube 5 B2T5 Clean Oxide Anneal |
Pre-Diffusion Clean | Clean |
25.00 Å -
2.00 μm
|
400 °C - 1100 °C
|
, , |
100 | |||||||||
Tystar Bank 2 Tube 6 B2T6 Clean Oxide |
Pre-Diffusion Clean | Clean |
25.00 Å -
2.00 μm
|
400 °C - 1100 °C
|
, , |
100 | |||||||||
Tystar Bank 2 Tube 7 Nitride B2T7 Clean Nitride |
Pre-Diffusion Clean | Clean |
25.00 Å -
2.00 μm
|
420 °C - 800 °C
|
, , |
50 |