The following is a list of equipment where 4 inch round substrates are allowed.
Manual development of resist in beakers. SNF approved developers only. No solvents!
Manual Film Thickness Measurement. Single or dual layer transparent films > 300 Ã
Direct Write
500Å to 300µm
To maintain cleanliness level, cleans of both the chamber and wafers are required prior to processing -
Substrates in clean category: Pre-Diffusion Clean
For semi-clean substrates: Standard Metal Clean (SRS100 + PRS1000) . Run Chamber clean (no dummies) and conditioning with clean dummies prior to run
Manual solvent cleaning of substrates or resist removal.
Pieces need a carrier wafer; Isotropic Etching
reactive O2/N2 sputtering, substrate bias, substrate heating, co-sputter
To maintain cleanliness level there are cleans required for both the chamber and wafers prior to processing -
CO2 drying after release of micromachined devices
Two programs: Singe and HMDS prime or Singe only. No Resist allowed!
For more than 300nm deposition, please contact Gabe Catalano <gcatalano@stanford.edu> in advance