Chemical Vapor Deposition, CVD, is a process by which films are deposited onto a substrate by the reaction between precursors at elevated temepratures and at atmomospheric or lower pressures. Volatile precursors or their by-products are absorbed and react at the wafer surface to produce the desired films. The characteristics of the deposited film such as crystalinty, composition, quality, etc. are dependent on deposition conditions. Films typically deposited using CVD processes are, but not limited to - silicon based compounds such as silicon, silicon dioxide, silicon nitride, slicon carbide, some Germanium based films and carbon based compounds. If the deposition occurs at atmospheric pressure, then the process is referred to as APCVD and if the process pressure is lower, it is LPCVD.
| Processing Technique | Equipment name & NEMO ID | Cleanliness | Materials Lab Supplied | Material Thickness Range | Substrate Size | Maximum Load (number of wafers) | Process Temperature Range | Gases | Cleaning Required |
Notes |
Stylus Tip Radius |
|---|---|---|---|---|---|---|---|---|---|---|---|
| Graphene CVD Growth |
Aixtron Black Magic graphene CVD furnace aixtron-graphene |
Flexible | 1x4" wafer or Copper/Nickel foil |
800 °C - 1100 °C
|
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| Low Pressure (LP) CVD |
Tystar Bank 1 Tube 3 Poly B1T3 Flexible Poly |
Flexible |
25.00 Å -
2.00 μm
|
100 |
420 °C - 630 °C
|
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| Low Pressure (LP) CVD |
Tystar Bank 3 Tube 12 Poly B3T12 Clean Poly |
Clean |
25.00 Å -
2.00 μm
|
50 |
420 °C - 630 °C
|
Pre-Diffusion Clean | |||||
| Low Pressure (LP) CVD |
Tystar Bank 3 Tube 10 Nitride B3T10 Clean Nitride |
Clean |
25.00 Å -
2.00 μm
|
50 |
420 °C - 800 °C
|
Pre-Diffusion Clean | |||||
| Low Pressure (LP) CVD |
Tystar Bank 2 Tube 7 Nitride B2T7 Flexible Nitride |
Flexible |
25.00 Å -
2.00 μm
|
50 |
420 °C - 800 °C
|
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| Low Pressure (LP) CVD |
Tystar Bank 1 Tube 4 LTO B1T4 Flexible LTO |
Flexible |
25.00 Å -
2.00 μm
|
100 |
300 °C - 500 °C
|
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| Low Pressure (LP) CVD |
Tystar Bank 3 Tube 11 TEOS B3T11 Clean TEOS |
Clean |
25.00 Å -
2.00 μm
|
50 |
420 °C - 630 °C
|
Pre-Diffusion Clean | |||||
| Low Pressure (LP) CVD |
Tystar Bank 2 Tube 8 LTO B2T8 Clean LTO |
Clean |
25.00 Å -
2.00 μm
|
100 |
300 °C - 500 °C
|
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| Plasma Enhanced (PE) CVD |
Oxford Plasma Pro PECVD Ox-PECVD |
Semiclean, Flexible |
100.00 Å -
4.00 μm
|
1 |
200 °C - 350 °C
|
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| Carbon Nanotube CVD Growth |
First Nano carbon nanotube CVD furnace cvd-nanotube |
Flexible | 1x4" wafer or multiple pieces |
800 °C - 1100 °C
|
Aligned single-walled carbon nanotube growth with ST-cut quartz substrates (available from SNF stockroom);1-15 single-walled carbon nanotubes per micron density |
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| EPI (CVD), Low Pressure (LP) CVD, Hydrogen (H2) Annealing, Doping, Plasma Enhanced (PE) CVD |
AMAT Centurion Epitaxial System epi2 |
Clean |
50.00 Å -
3.00 μm
|
1 |
600 °C - 1200 °C
|
Pre-Diffusion Clean |
N and P doping available- intrinsic to 5E19 Operating pressure range is 5-300Torr |
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| Metal-Organic (MO) CVD |
Aixtron MOCVD - III-V system aix200 |
Flexible |
0.00 -
5.00 μm
|
4"x1 wafer or 2"x1 wafer or 4 pieces |
300 °C - 800 °C
|
Pre-Diffusion Clean |
N and P doping available. For Si clean: SC1, SC2, HF dip. For III-V clean: HCl or HF dip. |
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| Metal-Organic (MO) CVD |
Aixtron MOCVD - III-N system aix-ccs |
Clean (MOCVD) |
0.00 -
5.00 μm
|
4"x1, 2"X3, pieces |
400 °C - 1300 °C
|
N and P doping available. For Si clean: SC1, SC2, HF dip. For Sapphire clean: SC1, SC2. For GaN template on Si or Sapphire: Piranha, SC1, SC2. |
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| Plasma Enhanced (PE) CVD |
PlasmaTherm Versaline HDP CVD System hdpcvd |
"All" |
500.00 Å -
4.00 μm
|
1 |
50 °C - 150 °C
|
To maintain cleanliness level there are cleans required for both the chamber and wafers prior to processing - Substrates in clean category: Pre-Diffusion Clean For semi-clean substrates: Standard Metal Clean (SRS100 + PRS1000) . Run Chamber clean (no dummies) and conditioning with clean dummies prior to run |
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| Plasma Enhanced (PE) CVD |
PlasmaTherm Shuttlelock PECVD System ccp-dep |
"All" |
100.00 Å -
4.00 μm
|
4 |
100 °C - 350 °C
|
To maintain cleanliness level, cleans of both the chamber and wafers are required prior to processing - Substrates in clean category: Pre-Diffusion Clean For semi-clean substrates: Standard Metal Clean (SRS100 + PRS1000) . Run Chamber clean (no dummies) and conditioning with clean dummies prior to run |