Characterization is a broad term that is used to describe any method of analysis of properties of materials and devices. The various tools listed here will use different techniques to study a wide variety of properties.
| Processing Techniques | Equipment name & NEMO ID | Teaser Blurb | Location |
|---|---|---|---|
| Characterization | SPF Measurement Bench | ||
| Step Profile | Dektak XT-S Stylus Profiler SNSF NPC |
Surface profiler measures step heights as small as 10nm. Stylus tip radius is 12.5 microns. |
SNSF NPC Spilker suite 6 |