Characterization is a broad term that is used to describe any method of analysis of properties of materials and devices. The various tools listed here will use different techniques to study a wide variety of properties.
| Processing Techniques | Equipment name & NEMO ID | Teaser Blurb | Cleanliness | Location |
|---|---|---|---|---|
| Reflectometry |
Nanospec 210XP nanospec2 |
Non-contact, spectro-reflectometry to measure the thickness of transparent films > 300 Ã (up to two) on substrates, such as silicon, that are reflective in the visible range. |
"All" | SNF Exfab Paul G Allen L104 Stinson |
| Optical Profilometer, Interferometry |
Sensofar S-neox s-neox |
3D optical profiler combining confocal, interferometry, and focus variation techniques to measure the surface height of smooth to very rough, ideally reflecting surfaces. |
"All" | SNF Paul G Allen L107 Cleanroom |