Characterization is a broad term that is used to describe any method of analysis of properties of materials and devices. The various tools listed here will use different techniques to study a wide variety of properties.
| Processing Techniques | Equipment name & NEMO ID | Teaser Blurb | Cleanliness |
Location |
|---|---|---|---|---|
| Dynamic Light Scattering |
Malvern Dynamic Light Scattering (DLS) Zetasizer malvern-dls |
Flexible | SNF Exfab Paul G Allen 155 Mavericks | |
| Characterization | SPF Measurement Bench | |||
| Step Profile | Dektak XT-S Stylus Profiler SNSF NPC |
Surface profiler measures step heights as small as 10nm. Stylus tip radius is 12.5 microns. |
SNSF NPC Spilker suite 6 |