Processing Techniques Equipment name & NEMO IDsort ascending Teaser Blurb Cleanliness Location
Optical Profilometer, Interferometry Sensofar S-neox
s-neox

3D optical profiler combining confocal, interferometry, and focus variation techniques to measure the surface height of smooth to very rough, ideally reflecting surfaces.

 "All" SNF Paul G Allen L107 Cleanroom
Step Profile Profilometer AlphaStep D-300
alphastep2

A stylus-based (tip radius 2 microns) surface profiler that measures step heights from 50nm to 300 µm on materials.  

 

 Flexible SNF Exfab Paul G Allen 104 Stinson
Step Profile Profilometer Alphastep 500
alphastep

Surface profiler measures step heights from 500 Å to 300 µm on materials in the flexible cleanliness group. Scan length from 100 Angstroms up to 0.3 mm. Stylus tip radius is 5 µm.

 

 Flexible SNF Exfab Paul G Allen 104 Stinson
Atomic Force Microscopy (AFM) Nanocue AFM
AFM NanoCue 		Flexible SNF Exfab Paul G Allen 155 Mavericks
Step Profile Dektak XT-S Stylus Profiler SNSF NPC

Surface profiler measures step heights as small as 10nm. Stylus tip radius is 12.5 microns.

 SNSF NPC Spilker suite 6
Atomic Force Microscopy (AFM) Asylum AFM
afm-asylum

Atomic force microscopy.

 Flexible SNF Exfab Paul G Allen 151 Ocean