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Stanford Nanofabrication Facility

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Characterization >
Surface Analysis >
Microscopy

Purpose

Scanning Electron Microscopy (SEM)

Microscopy

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Processing Technique	Equipment name & NEMO ID	Cleanliness	Substrate Size	Stylus Tip Radius
Microscopy	Keyence Digital Microscope VHX-6000 keyence	"All"	Pieces 2" 3" 4" 6"

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