Processing Techniques Equipment name & NEMO ID Teaser Blurb Cleanliness Locationsort ascending
Microscopy Keyence Digital Microscope VHX-6000
keyence

Microscopy

 "All" SNF Exfab Paul G Allen 104 Stinson
Scanning Electron Microscopy (SEM) SEM -Zeiss Merlin
sem-merlin

Mid-Range SEM for inspection of wafer defects, etch depths, and lithography overlay.

 "All" SNF Exfab Paul G Allen 104 Stinson